Factory Physics and Automation blog

When looking on the topic of improving Wafer FAB performance – the topic of lot and/or carrier tracking is often not in focus. For fully automated 300mm FABs this is really not an issue, because it is fully covered using RFID tags/pills on the FOUP and have any possible place where a FOUP can “sit”…… Continue reading Importance of carrier location tracking – part 1

In the last few weeks I had the opportunity to visit a few of our (FABMATICS) customer FAB’s here in the US – sure enough the topic of test wafers and the options and benefits to automate test wafer handling came up in all of them. They all categorized themselves into the area of higher…… Continue reading Test Wafer, part 3